윤곽 및 표면 측정 시스템Chotest
SJ5760
윤곽 및 표면 측정 시스템
Chotest
SJ5760
EXW 고정 가격 부가세 별도
€18,900
제조 연도
2024
상태
전시용 기계
위치
Leonberg 

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지도 표시
기계 정보
가격 및 위치
EXW 고정 가격 부가세 별도
€18,900
- 위치:
- Mühlstraße 41, 71229 Leonberg, Deutschland

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제안 세부 정보
- 광고 ID:
- A20678575
- 업데이트:
- 마지막 업데이트: 04.12.2025
설명
Precise Profile Measuring Instrument | Excellent Condition | Ready for Immediate Use
For sale is a Chotest SJ-5760P, a high-precision contour measuring instrument designed for geometric profile analysis in quality management, toolmaking, mechanical engineering, and research. This unit provides accurate measurements with extended travel ranges and features a stable granite base for reliable results.
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Condition
Cedpfx Afsx Db Steleaa
• Pre-owned, technically inspected
• Fully operational
• Very well maintained
—
Technical Highlights – Chotest SJ-5760P
Travel Ranges
• X-axis: 0–200 mm
• Z-axis: 0–450 mm
• Device dimensions: 800 × 450 × 1100 mm
• Weight: 220 kg
—
Profile Measurement (SJ-5760P)
• Measuring range Z1: ±25 mm
• Resolution: 0.001 µm
• Measurement direction: Top / Down
• Measuring speed: 0.05–5 mm/s
• Positioning speed: X/Z up to 20 mm/s
• Measuring force: 10–150 mN, adjustable
• Guideway deviation: ≤1 µm / 200 mm
Accuracy
• X-axis indication error: ±(0.5 + 0.015L) µm
• Z1-axis indication error: ±(0.5 + 0.05H) µm
• Distance: ±(0.8 + 0.02L) µm
• Radius: ≤(1 + R/15) µm
• Angle: ≤±45’’
—
Key Features
• Ideal for precise contour and profile measurements
• Extremely high vertical resolution (0.001 µm)
• Very stable granite base for low-vibration operation
• Large travel ranges for diverse component geometries
• User-friendly and reliable measuring technology
• Suitable for micron-accurate form measurement in both laboratory and production environments
이 광고는 자동으로 번역되었습니다. 번역 오류가 있을 수 있습니다.
For sale is a Chotest SJ-5760P, a high-precision contour measuring instrument designed for geometric profile analysis in quality management, toolmaking, mechanical engineering, and research. This unit provides accurate measurements with extended travel ranges and features a stable granite base for reliable results.
—
Condition
Cedpfx Afsx Db Steleaa
• Pre-owned, technically inspected
• Fully operational
• Very well maintained
—
Technical Highlights – Chotest SJ-5760P
Travel Ranges
• X-axis: 0–200 mm
• Z-axis: 0–450 mm
• Device dimensions: 800 × 450 × 1100 mm
• Weight: 220 kg
—
Profile Measurement (SJ-5760P)
• Measuring range Z1: ±25 mm
• Resolution: 0.001 µm
• Measurement direction: Top / Down
• Measuring speed: 0.05–5 mm/s
• Positioning speed: X/Z up to 20 mm/s
• Measuring force: 10–150 mN, adjustable
• Guideway deviation: ≤1 µm / 200 mm
Accuracy
• X-axis indication error: ±(0.5 + 0.015L) µm
• Z1-axis indication error: ±(0.5 + 0.05H) µm
• Distance: ±(0.8 + 0.02L) µm
• Radius: ≤(1 + R/15) µm
• Angle: ≤±45’’
—
Key Features
• Ideal for precise contour and profile measurements
• Extremely high vertical resolution (0.001 µm)
• Very stable granite base for low-vibration operation
• Large travel ranges for diverse component geometries
• User-friendly and reliable measuring technology
• Suitable for micron-accurate form measurement in both laboratory and production environments
이 광고는 자동으로 번역되었습니다. 번역 오류가 있을 수 있습니다.
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