표면 계측 시스템FRT
MicroProf MPR 1250
표면 계측 시스템
FRT
MicroProf MPR 1250
고정 가격 부가세 별도
€7,200
상태
중고
위치
Borken 

사진은 보여줍니다
지도 표시
기계 정보
가격 및 위치
고정 가격 부가세 별도
€7,200
- 위치:
- Einsteinstraße 8a, 46325 Borken, DE
전화하기
제안 세부 정보
- 광고 ID:
- A19101251
- 참조 번호:
- 24622
- 업데이트:
- 마지막 업데이트: 23.07.2025
설명
Fries Research & Technology
Device Designation: FRT MicroProf® MPR 1250
The FRT MicroProf® MPR 1250 is a high-precision surface metrology system from the MicroProf® series by Fries Research & Technology GmbH (FRT). These systems are designed for non-destructive and contactless analysis of surface parameters such as topography, roughness, layer thickness, and more.
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Features of the FRT MicroProf:
Device Details:
Model: FRT MicroProf® MPR 1250
Item Number: 200 00
Sensor Type: CWL 300 µm
Serial Number: 0904001
Measurement Principle: Chromatic confocal point sensor
Light Source: Halogen lamp, white light
Vertical resolution: up to 3 nm
Measurement accuracy (Z): 100 nm
Lateral resolution (XY): 2.5 µm
Measurement angle to surface: 90° ±30°
Max. sample size: approx. 310 x 310 x 50 mm
Technical Data (Excerpt):
XY-Stage:
Type: Compact XY-cross table
Travel (measurement range): 200 x 200 mm
Guidance: mechanical cross roller guide
Drive: DC motor with ball screw
Position feedback system: Heidenhain glass scale with reference mark
System resolution: 0.2 µm
Repeatability: < ±1 µm
Orthogonality XY: < 4 µm / 200 mm
Vertical runout (per axis): < 2 µm / 200 mm
Z-Axis (motorized):
Type: Linear axis
Travel: 50 mm (optional 100 mm)
Drive: Stepper motor with spindle drive
Lateral runout: < 2 µm / 50 mm
Manual Coarse Adjustment (optional):
Type: Dovetail guide
Adjustment range: up to 300 mm sample height
Measurement:
Minimum point spacing (XY): 0.6 µm
Sample size: approx. 310 x 310 x 50 mm
Max. sample weight: 5 kg (optional 10 kg)
Measuring speed: 1 µm/s up to max. 100 mm/s
System:
Total weight: approx. 275 kg (measurement setup: 225 kg)
Footprint (measurement setup): approx. 0.9 x 0.8 m
Dimensions control unit (W x D x H): approx. 0.55 x 0.53 x 0.32 m
Power supply (EU/US): 110–240 V, 50–60 Hz, 16 A
Power consumption: approx. 300–400 W
Operating Conditions:
Temperature range: 22 °C ±5 °C
Temperature stability: < 0.5 °C
Weight approx. 500 kg
Condition:
The device is in very good technical and cosmetic condition.
All axes move precisely and smoothly.
Scope of Delivery:
MicroProf® MPR200 00 XY measuring system
Control unit
Connection cables
(Subject to technical modifications and errors. All information without obligation!)
Inspection and onsite testing available by appointment.
For further questions, feel free to contact us by phone.
이 광고는 자동으로 번역되었습니다. 번역 오류가 있을 수 있습니다.
Device Designation: FRT MicroProf® MPR 1250
The FRT MicroProf® MPR 1250 is a high-precision surface metrology system from the MicroProf® series by Fries Research & Technology GmbH (FRT). These systems are designed for non-destructive and contactless analysis of surface parameters such as topography, roughness, layer thickness, and more.
Kedpfjwh Swdex Aatsdu
Features of the FRT MicroProf:
Device Details:
Model: FRT MicroProf® MPR 1250
Item Number: 200 00
Sensor Type: CWL 300 µm
Serial Number: 0904001
Measurement Principle: Chromatic confocal point sensor
Light Source: Halogen lamp, white light
Vertical resolution: up to 3 nm
Measurement accuracy (Z): 100 nm
Lateral resolution (XY): 2.5 µm
Measurement angle to surface: 90° ±30°
Max. sample size: approx. 310 x 310 x 50 mm
Technical Data (Excerpt):
XY-Stage:
Type: Compact XY-cross table
Travel (measurement range): 200 x 200 mm
Guidance: mechanical cross roller guide
Drive: DC motor with ball screw
Position feedback system: Heidenhain glass scale with reference mark
System resolution: 0.2 µm
Repeatability: < ±1 µm
Orthogonality XY: < 4 µm / 200 mm
Vertical runout (per axis): < 2 µm / 200 mm
Z-Axis (motorized):
Type: Linear axis
Travel: 50 mm (optional 100 mm)
Drive: Stepper motor with spindle drive
Lateral runout: < 2 µm / 50 mm
Manual Coarse Adjustment (optional):
Type: Dovetail guide
Adjustment range: up to 300 mm sample height
Measurement:
Minimum point spacing (XY): 0.6 µm
Sample size: approx. 310 x 310 x 50 mm
Max. sample weight: 5 kg (optional 10 kg)
Measuring speed: 1 µm/s up to max. 100 mm/s
System:
Total weight: approx. 275 kg (measurement setup: 225 kg)
Footprint (measurement setup): approx. 0.9 x 0.8 m
Dimensions control unit (W x D x H): approx. 0.55 x 0.53 x 0.32 m
Power supply (EU/US): 110–240 V, 50–60 Hz, 16 A
Power consumption: approx. 300–400 W
Operating Conditions:
Temperature range: 22 °C ±5 °C
Temperature stability: < 0.5 °C
Weight approx. 500 kg
Condition:
The device is in very good technical and cosmetic condition.
All axes move precisely and smoothly.
Scope of Delivery:
MicroProf® MPR200 00 XY measuring system
Control unit
Connection cables
(Subject to technical modifications and errors. All information without obligation!)
Inspection and onsite testing available by appointment.
For further questions, feel free to contact us by phone.
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