계측 시스템

Mahr XC2

Technical characteristics:

Measurement Capabilities
- Traversing length (X-axis): 0.2 mm to 120 mm
- Measuring range (Z-axis): 50 mm
- Resolution (Z-axis):
- Relative to stylus tip: 0.38 µm (with 350 mm probe arm), 0.19 µm (with 175 mm probe arm)
- Relative to measuring system: 0.04 µm
- Guide deviation: < 1 µm over 120 mm
- Measuring force (Z-axis): Adjustable from 1 mN to 120 mN
- Tracing angle: Up to 88° trailing edges, 77° rising edges

Performance & Speed
- Measuring speed (X-axis): 0.2 to 4 mm/s
- Contact speed (Z-axis): 0.1 to 1 mm/s
- Positioning speed:
- X-axis: 0.2 to 8 mm/s
- Z-axis: 0.2 to 10 mm/s

Stylus & Probe
- Probe arm lengths: 175 mm or 350 mm
- Stylus tip radius: 25 µm
- Stylus exchange: Magnetic mounting for tool-free changeover
- Calibration: Stored stylus-specific data for quick setup

System & Software
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- Control unit: MidRange Standard PC with MarWin-based XC2 software
- User interface: Touchscreen with intuitive icon navigation and Quick & Easy programming
- Evaluation capabilities:
- Regression lines, circles, points, radii, angles, coordinates
- Nominal/actual comparison
- DXF import (optional)
- Tolerance monitoring
- Automatic program runs

Included Components:
- CD 120 drive unit
- ST 500 measuring stand with granite plate (700 × 550 mm)
- MCP 23 manual control panel
- CT 120 XY table with rotary adjustment
- Calibration kit
- 17" TFT monitor

Machine status: Operational

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