계측 시스템

Mahr XC2

Technical characteristics:
Measurement Capabilities
- Traversing length (X-axis): 0.2 mm to 120 mm
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- Measuring range (Z-axis): 50 mm
- Resolution (Z-axis):
* Relative to stylus tip: 0.38 µm (with 350 mm probe arm), 0.19 µm (with 175 mm probe arm)
* Relative to measuring system: 0.04 µm
- Guide deviation: < 1 µm over 120 mm
- Measuring force (Z-axis): Adjustable from 1 mN to 120 mN
- Tracing angle: Up to 88° trailing edges, 77° rising edges

Performance & Speed
- Measuring speed (X-axis): 0.2 to 4 mm/s
- Contacting speed (Z-axis): 0.1 to 1 mm/s
- Positioning speed:
* X-axis: 0.2 to 8 mm/s
* Z-axis: 0.2 to 10 mm/s

Stylus & Probe
- Probe arm lengths: 175 mm or 350 mm
- Stylus tip radius: 25 µm
- Stylus exchange: Magnetic mount for tool-free swapping
- Calibration: Individual stylus data stored for rapid setup

System & Software
- Control unit: MidRange Standard PC with MarWin-based XC2 software
- User interface: Touchscreen with intuitive icons and Quick & Easy programming
- Evaluation features:
* Regression lines, circles, points, radii, angles, coordinates
* Nominal/actual comparison
* DXF import (optional)
* Tolerance monitoring
* Automatic program runs

Included Components:
- CD 120 drive unit
- ST 500 measuring stand with granite plate (700 × 550 mm)
- MCP 23 manual control panel
- CT 120 XY table with rotary adjustment
- Calibration set
- 17" TFT monitor

Machine status:
NOT WORKING – License key lost, requires new reboot with license key.

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